Multilayer eddy current probe array for complete coverage of an inspection surface without mechanical scanning

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5659248
SERIAL NO

08632182

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

An eddy current surface measurement array structure for complete coverage of an underlying inspection surface without requiring mechanical scanning is disclosed. A three-dimensional array of eddy current sense elements is organized as a plurality of layers of two-dimensional sub-arrays. The sub-arrays, although in different layers, are essentially identical in configuration, and are staggered such that the sense elements of one layer provide at least partial coverage of portions of the inspection surface not covered by the sense elements of another layer. As many staggered layers are included as are necessary to ensure that no 'blind spots' remain, for complete coverage of the underlying inspection surface. The sense elements are disposed in a layered flexible structure fabricated employing high density interconnect fabrication techniques or other photolithographic techniques. Static (electronic) scanning is employed, by individual layer and by row and column within each layer, to form a two-dimensional image of the inspection surface.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

  • GENERAL ELECTRIC COMPANY

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hedengren, Kristina Helena Valborg Schenectady, NY 16 367
Kornrumpf, William Paul Albany, NY 18 619

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation