Method and apparatus for measuring thickness of layer using acoustic waves

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United States of America Patent

PATENT NO 5663502
SERIAL NO

08544932

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Abstract

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Ultrasonic waves from a transmit device are transmitted to an object subject to measurement. A surface reflected wave propagated in a contact medium and reflected at the surface of a tube and bottom surface reflected waves passing through an oxidation layer on the tube and reflected at the inner surface of the tube are convened into electric signals. A feature extracting part 5, in consideration of a correlation relationship of energy with respect to the frequency of a received signal, based on the received signal of ultrasonic waves converted to electric signals, extracts a signal feature data determined beforehand which has a strong correlation relationship with the thickness of a measured part. Based on the extracted signal feature data, a thickness conversion part references a relationship storage part which has stored therein beforehand a function that shows a relationship between the signal feature data and the thickness of the oxidation layer, and obtains the thickness of the oxidation layer.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTD6-6 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 1008280 ?1008280
HITACHI NUCLEAR ENIGINEERING CO LTD2-2 SAIWAICHO 3-CHOME HITACHI-SHI IBARAKI-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujiwara, Kenichi Hitachi, JP 77 1174
Koike, Masahiro Hitachi, JP 79 719
Michiguchi, Yoshihiro Ibaraki-ken, JP 7 261
Nagashima, Yoshiaki Hitachi, JP 13 189
Sato, Masao Kitaibaraki, JP 76 670
Takahashi, Fuminobu Hitachinaka, JP 27 528
Umehara, Hajime Hitachinaka, JP 16 190

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