Electrostatic chuck with mechanism for lifting up the peripheral of a substrate

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United States of America Patent

PATENT NO 5677824
SERIAL NO

08755551

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Abstract

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An electrostatic chuck applicable to, e.g., an epitaxial apparatus or an etching apparatus for electrostatically chucking a semiconductor substrate or wafer is disclosed. The chuck includes a stage for electrostatically retaining the wafer thereon. A plurality of lift pins are elevatable to thrust up the wafer. A plurality of release pins are arranged on the stage for thrusting up the peripheral portion of the wafer. A plurality of drive mechanisms respectively thrust up the release pins stepwise within the allowable elastic deformation range of the wafer. A control device selectively actuates the release pins via the associated drive mechanisms.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATION108-8001 TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akimoto, Takeshi Tokyo, JP 22 378
Harashima, Keiichi Tokyo, JP 4 96

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