Probe apparatus for use in both high and low frequency measurements
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 21, 1997
Grant Date -
N/A
app pub date -
Feb 2, 1995
filing date -
Feb 4, 1994
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully