Device data acquisition
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United States of America Patent
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Nov 11, 1997
Grant Date -
N/A
app pub date -
Oct 30, 1995
filing date -
Oct 30, 1995
priority date (Note) -
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Importance
Abstract
Data samples are obtained from a control device while in use to control a material process. Selected ones of these samples are stored which represent results of operating the device over portions of its characteristics, and they are selectively combined to provide an indication of the complete device characteristics. Selected such data samples are used provide information concerning selected control device parameters based on the device characteristics.
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