Apparatus for automatically measuring the thickness of a transparent coating material using a white light source
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United States of America Patent
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Dec 9, 1997
Grant Date -
N/A
app pub date -
Sep 8, 1995
filing date -
Nov 16, 1994
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus for measuring a thickness of a coating formed on a surface of a component member includes a white light source for emitting a light beam to be reflected by the surface of the member, one or more filters, each of the filters capable of filtering the reflected light beam in a selected wavelength range, an identical number of photo-detection sections as filters, each of the photo-detection sections being used for converting the intensity of the filtered light beam into a counting reference signal having a logic high and low states, a counter for counting the logic high states to generate a count number and a signal processor for computing the coating thickness based on the count number. Each of the photo-detection sections has a photo-detector, an ampere-to-voltage convertor, a peak voltage value detector and a comparator.
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