Apparatus for measuring the thickness and/or irregularity of slivers
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United States of America Patent
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Dec 16, 1997
Grant Date -
N/A
app pub date -
Jul 1, 1996
filing date -
Jun 29, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The invention relates to a device for measuring the thickness and/or irregularity of slivers, with a compacting part (2) compacting the sliver and with a measuring part which has a gutter-like guide conduit (8) for the compacted sliver and a sensing member (10) which senses the sliver mechanically and which is adjustable relative to the guide conduit. In order to allow more accurate measurement, the sensing member is likewise of gutter-like design in a region in contact with the sliver and forms a kind of guide conduit (15), so that, in the measuring part, the sliver runs through a guide conduit consisting of a fixed part (13) and of a part (14) adjustable relative to the fixed part (13). The adjustable part is fastened to deflectable carriers (11, 12), and the measurement of the thickness and/or irregularity of the sliver is carried out by measuring the adjustment of at least one of the said carriers.
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