Method and apparatus for terahertz imaging

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United States of America Patent

PATENT NO 5710430
SERIAL NO

08711823

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Abstract

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Certain material and objects can be characterized by a frequency-dependent absorption, dispersion, and reflection of terahertz transients in signals which pass illuminate the material or object. The present terahertz imaging system analyses that frequency dependence in the time-domain by collecting that transmitted signal propagating through the object and then processing the information contained in those signals for every point or 'pixel' on that object. This is a non-invasive imaging technique that is capable of differentiating between different materials, chemical compositions, or environments.

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Patent Owner(s)

Patent OwnerAddress
ALCATEL-LUCENT USA INC600-700 MOUNTAIN AVENUE MURRAY HILL NJ 07974

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nuss, Martin C Fair Haven, NJ 27 1430

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