Similarity determination among patterns using affine-invariant features

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United States of America Patent

PATENT NO 5719959
SERIAL NO

08437049

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Abstract

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Pattern recognition, for instance optical character recognition, is achieved by forming a skeletal representation (400) of a pattern (300), processing the skeletal diagram (400) to improve representation of curved lines (308) in the pattern (300), representing the processed skeletal diagram (500) by a connectivity matrix (602), and finding a minimum spectral distance between the connectivity matrix (602) and a set of template matrices corresponding to known patterns.

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Patent Owner(s)

Patent OwnerAddress
CANON INC30-2 SHIMOMARUKO 3-CHOME OHTA-KU TOKYO 146-8501

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Krtolica, Radovan V Palo Alto, CA 11 156

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