Method of making a semiconductor substrate having gettering effect

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United States of America Patent

PATENT NO 5721145
SERIAL NO

08668878

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Abstract

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The present invention is mainly characterized in that a semiconductor substrate improved so as to maintain a gettering effect for a long time can be obtained. A polycrystalline silicon film is formed on the rear surface of a semiconductor substrate. A silicon oxide film and silicon nitride film are formed over the rear surface of semiconductor substrate so as to cover polycrystalline silicon film.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI DENKI KABUSHIKI KAISHATOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kokawa, Yoshiko Hyogo, JP 5 68
Kusakabe, Kenji Hyogo, JP 14 294
Sekine, Masahiro Hyogo, JP 85 1248

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