Device-under-test card for a burn-in board
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United States of America Patent
Stats
-
Mar 10, 1998
Grant Date -
N/A
app pub date -
Oct 7, 1994
filing date -
Feb 8, 1994
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A device-under-test card includes a matrix of fuses and/or antifuses formed as part of a multi-layered structure. The matrix of fuses and/or antifuses can be electrically programmed to connect any one of first electrical contacts to any one of second electrical contacts and so allows the device-under-test card to act as a junction between burn-in board traces couplable to signal drivers and/or receivers and burn-in board traces couplable to terminals of a device-under-test. The device-under-test card also includes a discrete resistor or alternatively a resistor ladder that permits a terminal of a device-under-test to be coupled to a power or ground terminal or to any combination of resistances including a short, in addition or as an alternative to any one of various signal drivers and/or receivers.
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