Method for detecting abnormal patterns
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United States of America Patent
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-
Mar 24, 1998
Grant Date -
N/A
app pub date -
Oct 9, 1996
filing date -
Oct 11, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Prospective abnormal patterns in a radiation image of an object are detected in accordance with an image signal representing the radiation image. A probability density function of the image signal, which corresponds to a region, that is inward from a contour of each of the prospective abnormal patterns having been detected, and a neighboring region, is formed. Probability density function information in accordance with the probability density function is obtained. A definite prospective abnormal pattern, which is among the prospective abnormal patterns having been detected and has a high level of probability that it will be the true abnormal pattern, is detected in accordance with the probability density function information.
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