Fractal dimension analyzer and forecaster

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United States of America Patent

PATENT NO 5732158
SERIAL NO

08344742

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Abstract

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A system for generating deciphering symbols or roots and particularly to systems employing fractal metric characterizations, which in turn are based upon fractal dimensions of less than the whole of the data to be characterized.

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Patent Owner(s)

Patent OwnerAddress
TEC - MASTERS INC1500 PERIMETER PARKWAY SUITE 400 HUNTSVILLE AL 35806

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jaenisch, Holger M Madison, AL 15 204

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