Apparatus and method for analyzing particles including shifting a judgement region

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United States of America Patent

PATENT NO 5735274
SERIAL NO

08675260

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Abstract

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An apparatus and method for analyzing particles includes a distribution data preparation device for measuring parameters that characterize particles contained in a specimen and for preparing a distribution data of the particles in a coordinate space based on the parameters, a judgement region storage device for storing in advance a predetermined judgement region in the coordinate space, a base point extraction device for extracting, when the distribution data forms at least one group, a group base point that shows a position of the group, a judgement region correction device for correcting a position of the judgement region in the coordinate space by referring to each group base point extracted every time a distribution data is prepared by the distribution data preparation device, and a judgement device for judging the specimen based on the particles present within the corrected judgement region.

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Patent Owner(s)

Patent OwnerAddress
TOA MEDICAL ELECTRONICS CO LTDHYOGO-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mishima, Yoshihiro Kobe, JP 19 113
Shibata, Kimiyo Kakogawa, JP 2 8

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