Nonlinear ultrasonic scanning to detect material defects

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United States of America Patent

PATENT NO 5736642
SERIAL NO

08778066

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Abstract

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A method and system are provided to detect defects in a material. Waves of known frequency(ies) are mixed at an interaction zone in the material. As a result, at least one of a difference wave and a sum wave are generated in the interaction zone. The difference wave occurs at a difference frequency and the sum wave occurs at a sum frequency. The amplitude of at least one nonlinear signal based on the sum and/or difference waves is then measured. The nonlinear signal is defined as the amplitude of one of the difference wave and sum wave relative to the product of the amplitude of the surface waves. The amplitude of the nonlinear signal is an indication of defects (e.g., dislocation dipole density) in the interaction zone.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL AERONAUTICS AND SPACE ADMINISTRATION (NASA)WASHINGTON DC 20546

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cantrell, John H Yorktown, VA 17 479
Yost, William T Newport News, VA 48 983

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