System for detecting faults in connections between integrated circuits and circuit board traces
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United States of America Patent
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Apr 7, 1998
Grant Date -
N/A
app pub date -
Jun 22, 1995
filing date -
Jun 22, 1995
priority date (Note) -
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Abstract
A system for detecting open circuits in connections between pins of an integrated circuit (IC) and traces on a circuit board on which the IC is mounted makes use of a-c paths inherent in the IC. An input signal is applied to a trace to which a pin of the IC is nominally connected. An internal a-c path in the IC carries the signal to another pin. Failure to detect an output signal derived from the input signal, above predetermined thresholds, at the trace to which the latter pin is nominally connected indicates failure of a pin-to-trace connection.
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