Exposure method and apparatus

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United States of America Patent

PATENT NO 5739898
SERIAL NO

08312241

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Abstract

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The present invention relates to a projection exposure method and an exposure apparatus for projecting a pattern on a photo-mask through a projection optical system onto a predetermined photosensitive material. The photosensitive material is a nonlinear photosensitive material in which the effective light intensity distribution is nonlinear to the intensity of incident exposure light. Further, multiple exposure is made with plural patterns having a certain lateral shift therebetween, or multiple exposure is made with shifting the position of an identical pattern, whereby multiple exposure is effected with patterns different in intensity distribution on the photosensitive material. A high-resolution pattern can be formed over the resolution limit of projection optical system by the above arrangement.

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Patent Owner(s)

Patent OwnerAddress
NIKON CORPORATION2-3 MARUNOUCHI 3-CHOME CHIYODA-KU TOKYO 100-8331

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kameyama, Masaomi Bunkyo-ku, JP 18 546
Komatsu, Masaya Fukaya, JP 7 126
Ooki, Hiroshi Yokohama, JP 21 337
Ozawa, Toshihiko Yokohama, JP 16 546
Shibuya, Masato Ohmiya, JP 43 937
Tokoyoda, Yoshifumi Chiba, JP 5 142

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