Method and apparatus for identifying and correcting date calculation errors caused by truncated year values

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United States of America Patent

PATENT NO 5740442
SERIAL NO

08704225

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A standardized test environment assists identifying problematic instances of instructions in computer programs that produce erroneous results caused by dates having years expressed in a truncated form. A standardized production environment takes corrective action for specified instances of instructions by modifying one or more values such that the instructions achieve correct results. In one embodiment of a test environment, a computer system collects diagnostic information for instances of subtraction operations that produce negative results. In one embodiment of a production environment, a computer system intercepts execution of a computer program at specified locations and takes corrective action according to information obtained from a table of control information.

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Patent Owner(s)

  • HITACHI DATA SYSTEMS CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cox, William Gary Mountain View, CA 2 26
Demaray, Milton Wayne Fremont, CA 2 26

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