Method of and apparatus for automatic handling of test pieces
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United States of America Patent
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Apr 28, 1998
Grant Date -
N/A
app pub date -
Apr 15, 1996
filing date -
Apr 15, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The present invention relates to a method of and an apparatus for handling test pieces in which a stack of test pieces is formed on a lift table of the apparatus and are brought into a predetermined position by a slide, which displaces the test pieces horizontally against a guide bead, with the test pieces being lifted-off the stack and transported to a test position by a first transporter having replaceable test piece-specific holding and positioning elements, and with the test pieces being transported from the test position to a storing position by a second transported having replaceable test piece-specific holding elements.
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