Image inspection device
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United States of America Patent
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-
May 26, 1998
Issued Date -
N/A
app pub date -
May 23, 1997
filing date -
Aug 20, 1992
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An image inspection device includes correlation calculating device for calculating a correlation value between sample image data and reference image data and correction device for correcting the sample image data according to the calculated correlation value. A comparator compares the corrected sample image data with the reference image data. The correlation value can be a correlation between an X-direction projection pattern and a Y-direction projection pattern, or the correlation value can be a density distribution correlation. With the projection pattern correlation, the read timing of the reference image data for the comparison is delayed according to the correlation value. With the density distribution correlation, the density distribution of the sample image data is corrected according to the correlation value.
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Cited Art Landscape
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