Testing series passive components without contacting the driven node
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United States of America Patent
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Jun 2, 1998
Issued Date -
N/A
app pub date -
Mar 3, 1997
filing date -
Jun 7, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of testing series passive components in electronic assemblies. Only one test pin per passive component is required, thereby reducing the cost and complexity of test fixtures and the electronic assemblies. A passive component is connected between the output of a driving circuit and (optionally) an input of a receiving circuit. The output of the driving circuit is placed in a low impedance state. The receiving end of the passive component is stimulated and the response is measured. For reactive components, the stimulus and response are AC. For resistors, multiple DC measurements may be made. A optional DC bias may be provided to limit DC current and to further reduce the small signal output impedance of the driving circuit.
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