Method and apparatus for testing magnetic heads and disks
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United States of America Patent
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Jun 2, 1998
Grant Date -
N/A
app pub date -
Feb 2, 1996
filing date -
Feb 2, 1996
priority date (Note) -
Expired
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Abstract
An apparatus for testing magnetic heads and disks comprises a phase locked loop (11) with a phase detector (13) formed by an analog-to-digital converter (40) and a digital-to-analog converter (50). A sine wave signal is supplied to an analog input of an ADC (40) and raw data pulses are supplied to the clock input the of ADC. A phase detector (13) detects deviations in the positions of raw data pulses from the zero crossings of the sine wave signal. A PLL (11) locks in the locations of the zero crossings of the sine wave signal and ADC samples constitute instantaneous values of a bit-shift distribution. These values are processed by a DSP (70). The resulting bit-shift distribution is generated during one disk revolution.
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