Method for testing integrated circuit devices
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United States of America Patent
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Jun 2, 1998
Grant Date -
N/A
app pub date -
Oct 16, 1992
filing date -
Oct 16, 1992
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method for testing integrated circuit devices and electronic devices. An integrated circuit device has one or more electronic devices, each having a channel of a particular length. In order to test an integrated circuit device or an individual electronic device, a voltage is applied to the device under test. The amount of voltage applied is a function of the channel lengths of the device being tested and, in particular, it is a function of the shortest channel lengths existing in the device being tested. This ensures that a safe voltage is applied to the device being tested.
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