Integrated circuit test power supply
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United States of America Patent
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-
Jun 30, 1998
Grant Date -
N/A
app pub date -
Sep 29, 1995
filing date -
Sep 29, 1995
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A power supply for testing an integrated circuit includes a source voltage input terminal for receiving an input voltage. The power supply serves as both a DUT active power supply and an IDDQ measurement circuit, without the need for switching between separate DUT active power supply and IDDQ measurement circuits. In one embodiment, a current source output driver includes a diode across a current sensing resistor inside a feedback loop. This minimizes VDD changes when the DUT demands transient current, such as when loading IDDQ test vectors. Moreover, with decreased transient changes in VDD, dielectric absorption effects of a decoupling capacitor are reduced.
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