Pattern recognition by unsupervised metric learning
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United States of America Patent
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Jun 30, 1998
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N/A
app pub date -
Jul 17, 1995
filing date -
Jul 17, 1995
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Abstract
A pattern recognition method uses unsupervised metric learning starting from a mixture of normal densities which explains well observed data. An improved decision rule is provided for selecting the reference database element most likely to correspond to a query.
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