Refresh counter for synchronous dynamic random access memory and method of testing the same

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United States of America Patent

PATENT NO 5790468
SERIAL NO

08862699

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Abstract

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A refresh counter for an SDRAM and a method of testing the same. An internal bank select address for the test of the refresh counter has a predetermined state in a test mode to correspond to an external bank select address in a burst mode, so that the refresh counter can simply be tested in the test mode. The refresh counter comprises a first counter circuit for outputting a least significant bit as the internal bank select address in the test mode in response to an address signal and a reset pulse signal. The address signal is generated in each automatic refresh cycle, and the reset pulse signal is generated when the present mode is set to the test mode by a mode register set command. The refresh counter further comprises n second counter circuits connected in series to the first counter circuit, for outputting n bits of a row address.

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Patent Owner(s)

Patent OwnerAddress
HYUNDAI ELECTRONICS INDUSTRIES CO LTDGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Oh, Jong Hoon Kyoungki-do, KR 86 989

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