Method of automatically generating dummy metals for multilevel interconnection

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United States of America Patent

PATENT NO 5798298
SERIAL NO

08598802

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Abstract

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A method of automatically generating dummy metals for multilevel interconnection makes use of a quantum array pattern accompanying an operating pattern to from a metal pattern. The method comprises the combination selected from intersection (AND), union (OR), oversizing, downsizing, or incorporation operation through computer-aided design (CAD). Therefore, the application of the metal pattern to a process for fabricating a multimetal structure can acquire full planarization between two metal layers because of the arrangement that several dummy metals are positioned among the metal lines to diminish the spacing which exceeds the planarization limit. Also, the dummy metals are shaped in blocks thereby preventing the loading effect during etching and decreasing the parasitic capacitance therebetween.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPORATIONNO 3 LI-HSIN RD II SCIENCE-BASED INDUSTRIAL PARK HSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pan, Hong-Tsz Hsinchu Hsien, TW 36 488
Yang, Ming-Tzong Hsinchu, TW 112 1565

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