System and method for stable analysis of sampled transients arbitrarily aligned with their sample points
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United States of America Patent
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Aug 25, 1998
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N/A
app pub date -
Feb 28, 1996
filing date -
May 5, 1993
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Expired
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Abstract
A method of stably identifying and characterizing a transient contained in a sampled set of data, the data representing a physical event, where alignment of the sample points with the transient is typically arbitrary. The method includes the steps of analyzing the first data set using a predefined mathematical operator to produce a second data set, detecting and isolating the discrete data pattern in the second data set, determining a location of the detected and isolated data pattern in the second data set, measuring a difference between the location of the detected and isolated data pattern and a predetermined location of the predefined mathematical operator, adjusting the location of the discrete data pattern in the second data set to align it with the predefined mathematical operator in accordance with the measured location difference, or, vice versa, aligning the mathematical operator with the discrete data pattern in accordance with the measured location difference and analyzing the aligned data pattern with the predefined mathematical operator.
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