Fault locating device, system and method
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United States of America Patent
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-
Sep 8, 1998
Issued Date -
N/A
app pub date -
Dec 9, 1996
filing date -
Apr 5, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A lamp system is for use in non-destructive testing to illuminate luminescent materials, such as fluorescent dyes. The lamp system has a control unit and a lamp. The lamp has a bulb and a filter. The bulb generates at least a first wavelength of invisible energy and the filter limits other visible wavelength light from the lamp. The lamp has a handle with a trigger. The control unit pulses the lamp on and off when the trigger is depressed. The luminescent material absorbs the first wavelength of energy and pulses in response when the lamp illuminates the material. The system can be AC or DC operated. It can be operated from an automotive battery.
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