Method for measuring RF pulse rise time, fall time and pulse width
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 8, 1998
Issued Date -
N/A
app pub date -
Jun 13, 1997
filing date -
Oct 21, 1994
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method for measuring the rise/fall time and pulse width of RF pulses using multi-purpose, commercial-off-the-shelf test devices, such as an RF signal down converter, a digitizer and a signal processor. The method is based on digitizing the RF signals and developing an average sample pulse waveform. The rise/fall time and pulse width are then calculated from data points on the sample waveform. The method is suitable for real-time calculations of the rise/fall time and pulse width.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully