Semiconductor probe card for low current measurements

United States of America Patent

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Sep 15, 1998
Grant Date
N/A
app pub date
Jun 7, 1996
filing date
Jun 7, 1996

priority date (Note)
Expired

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Abstract

A semiconductor probe card is provided with low dielectric absorption feed-through contacts to isolate test lines from printed circuit board leakage effects.

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Patent Owner(s)

Patent Owner	Address
KEITHLEY INSTRUMENTS INC	28775 AURORA ROAD CLEVELAND OH 44139

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G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

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[Patents Count]

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Inventor Name	Address	# of filed Patents	Total Citations
Bennett, Robert	Mantua, OH	603	83089
Knauer, William	Chagrin Falls, OH	32	276

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Semiconductor probe card for low current measurements

Number of patents in Portfolio can not be more than 2000

United States of America Patent

08660441

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PATENT NO	5808475
SERIAL NO	08660441
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08660441

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