Method for fabricating thin film transistor device

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United States of America Patent

PATENT NO 5817548
SERIAL NO

08745284

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Abstract

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A method for crystallizing a portion of a semiconductor thin film while forming a semiconductor device comprises providing a transparent substrate supporting a metallic gate electrode and an amorphous semiconductor thin film which are separated from each other by a gate insulating film, heating the gate electrode by subjecting it to light rays, and applying a laser beam to the amorphous semiconductor thin film so that the portion of the semiconductor thin film adjacent the metallic gate electrode is heated by both the laser beam and the heat of the gate electrode to cause a crystallization of a portion of the amorphous thin film and then processing the remaining amorphous portions of the thin film to form the transistor structure.

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Patent Owner(s)

Patent OwnerAddress
JAPAN DISPLAY WEST INC50 AZA KAMIFUNAKI O-AZA OGAWA HIGASHIURA-CHO CHITA-GUN AICHI-KEN 470-2102

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Noguchi, Takashi Kanagawa, JP 227 4012
Shimogaichi, Yasushi Kanagawa, JP 13 571

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