Method for testing the authenticity of a data carrier having an integrated circuit
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United States of America Patent
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Oct 6, 1998
Grant Date -
N/A
app pub date -
Jun 30, 1989
filing date -
Oct 30, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method for testing the authenticity of data carriers having integrated circuits, memory and logic means to determine physical properties of each circuit that are distinctive of this circuit and use them to obtain data characteristic of each circuit. According to the present invention, one preferably evaluates the different programming times of the memory cells of an E.sup.2 PROM memory, an evaluation which can be determined by various methods and processed as distinctive characteristics. Other individual properties that can be utilized are, for example, distinctive features of a memory input.
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