Multi-probe system for dimensional metrology
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United States of America Patent
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Oct 20, 1998
Grant Date -
N/A
app pub date -
Jun 20, 1996
filing date -
Jun 20, 1996
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A multi-probe system for dimensional metrology. This system utilizes a probe base that is attachable to a coordinate measuring machine and that includes a plurality of probes mounted at spaced-apart locations on the base. The probes are interconnected with the coordinate measuring machine and generate measurement signals based upon interaction with a workpiece. By providing a plurality of probes on a single assembly, multiple measurements can be made on a workpiece in a single measurement cycle.
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