Method and apparatus for testing the data output system of a memory system
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United States of America Patent
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Oct 20, 1998
Grant Date -
N/A
app pub date -
Sep 30, 1996
filing date -
Sep 30, 1996
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for testing or verifying proper operation of a data output system of a memory system are provided. A known data signal is applied to a bit line, independent of the memory cells of the memory system associated with the bit line. Expected outputs of the data output system are determined based upon the formation or configuration of the data output system and the known data signal. Following application of the known data signal to the bit line, actual outputs of the data output system are compared to the expected outputs to verify proper operation of the data output system.
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- Non-US Classification not provided for expired patents
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