Method and apparatus for diagnosis skin lesions
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United States of America Patent
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Nov 10, 1998
Grant Date -
N/A
app pub date -
Feb 9, 1996
filing date -
Feb 9, 1996
priority date (Note) -
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Abstract
A method and apparatus for determining skin lesion parameters comprise directing light to the skin in which the lesion is located and monitoring the reflection of that light. Then, the spatial and spectral distribution of the reflected light is analyzed. The depth is determined by finding a location where the difference between a spectral intensity of reflected light and an average reflected intensity is greater than a maximal difference between the intensity of each point and an average intensity for normal skin. The wavelength of the light reflected from the location is determined, and from the wavelength the penetration depth is determined. The penetration depth is also the depth of the lesion below the skin surface. The size is determined by determining a plurality of locations where the deviation between the spectral intensity and the average intensity is greater than the maximal deviation for normal skin. Based on the spatial distribution of the locations the size of the lesion is determined.
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