Bit characteristics measurement system for digitally modulated signals

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United States of America Patent

PATENT NO 5835530
SERIAL NO

08729486

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Abstract

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System for measurement of the bit period (or bit rate or baud rate or symbol rate) and bit epoch (or symbol epoch) of a digitally modulated signal by extracting a bit time-of-transition array, determining an emphasis array with individual elements thereof relating to corresponding elements of the bit time-of-transition array, and using linear regression on the bit time-of-transition array with the emphasis. The emphasis array is formed from the signal amplitude, signal to interference ratio, or probability of a bit not being in error. One of several matched filters is dynamically selected based on the data content of the signal and used to detect bit transitions. The system has application in time varying multi-path fading environments. The system operates on signals with low SNR, high co-channel interference, or high intersymbol interference. Useful in transmitter identification, range finding, mobile transmitter location, and frequency hop intercept systems.

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Patent Owner(s)

Patent OwnerAddress
AUTHORIZE NET LLC1295 CHARLESTON AVE MOUNTAIN VIEW CA 94043

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hawkes, Kelly Davidson Los Altos, CA 10 647

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