Method for stabilizing polysilicon resistors

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United States of America Patent

PATENT NO 5837592
SERIAL NO

08568712

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Abstract

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A method for stabilizing a polysilicon resistor. Formed through a conventional method upon a semiconductor substrate is a polysilicon resistor. The polysilicon resistor is treated with a nitrogen plasma. After treatment with the nitrogen plasma, the polysilicon resistor exhibits a high and stable resistance having minimal susceptibility to variation due to intrusion of hydrogen or other reactive species into the polysilicon resistor.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTDHSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Ming-Hsung Hsin-Chu, TW 6 227
Weng, Chun-Wen Chia-I, TW 3 59

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