Method of determining the distance of a feature on an object from a microscope, and a device for carrying out the method

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United States of America Patent

PATENT NO 5841149
SERIAL NO

08722021

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention is directed to a surgical microscope in which, to determine the distance between the microscope (8, 13) and the object (22), the travel time of a beam of light (57c) emanating from the microscope and reflected by the object is determined. The travel time is determined by phase measurement or by interference matching. In the case of direct phase measurement, modulated light is used. In the case of interference matching, partly coherent light is used. In order to ensure high accuracy over wide measurement range, the two measurement methods are preferably used in combination.

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Patent Owner(s)

Patent OwnerAddress
LEICA INSTRUMENTS (SINGAPORE) PTE LTDSINGAPORE SINGAPORE CITY SINGAPORE CITY SINGAPORE

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Braunecker, Bernhard Rebsteom, CH 30 863
Mayer, Thomas Hohenems, AT 167 3264
Rogers, John Rice Heerbrugg, CH 12 132
Spink, Roger Balgach, CH 24 334
Zimmer, Klaus-Peter Heerbrigg, CH 16 230

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