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Abstract

Testing of digital-to-analog converters is accelerated by applying one or more different approaches. One approach relies on a switched capacitor, which lowers the overall capacitance of the converter during testing, thereby reducing the settling time for each code value. Another approach makes the duration of each testing step a function of the particular code value, rather than using the worst-case settling time for each testing step. Yet another approach uses a sequence of non-consecutive code values to determine whether each switch in the converter is functional. Using non-consecutive code values permits the use of partial settling times during converter testing. Each of the approaches can be used to accelerate the testing of D/A converters, whether they have linear or folded resistor strings.

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