Test handler for DUT's
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United States of America Patent
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-
Dec 8, 1998
Grant Date -
N/A
app pub date -
Dec 4, 1995
filing date -
Dec 4, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A handling system for devices under test (DUTs), i.e. semiconductor chips. A rotatable platform is provided which platform has a plurality of boats or nests. The DUTs are inserted in the boats. The platform carrying the DUTs is indexed through a plurality of treatment stations to precondition the chips specifically to bring the chip to a test temperature. At a test station, the chip is removed from the boat and inserted into a manufacturer's test head. The chip is tested, returned to the boat and indexed to a treatment station(s) downstream of the test head where is ultimately removed for further processing.
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