Electrical contact probe for sampling high frequency electrical signals
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 8, 1998
Grant Date -
N/A
app pub date -
Aug 8, 1996
filing date -
Aug 8, 1996
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An all-electrical high frequency contact sampling probe provides sub-micron spatial resolution and picosecond or sub-picosecond temporal resolution. In a preferred embodiment, the probe is a monolithic integration of a sampling circuit with a cantilever and probe tip, where the distance between the circuit and the tip is less than a wavelength of interest in an RF signal ?V.sub.RF !. The sampling circuit ?44! uses Schottky diodes ?SD! for sampling the RF signal ?V.sub.RF ! from a device under test at a rate determined by local oscillator signals ?50, 52!. An IF signal ?V.sub.IF ! produced by the sampling probe is an equivalent time representation of the RF signal. Applications include testing signals at interior nodes of high speed integrated circuits.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully