Defective pixel detecting circuit of a solid state image pick-up device capable of detecting defective pixels with low power consumption and high precision, and image pick-up device having such detecting circuit
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United States of America Patent
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-
Dec 29, 1998
Grant Date -
N/A
app pub date -
Aug 12, 1996
filing date -
Aug 29, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Image pick-up device reads image pick-up signals of all the pixels of CCD2 once when an optical system is in light intercepted state. By comparing the image pick-up signal from each pixel with a first threshold value THL1, a possibly defective pixels are extracted. Thereafter, by reading the image pick-up signals for a prescribed number of times from the CCD2, accumulated value of the image pick-up signals of each of the possibly defective pixels is calculated. Based on the result of comparison between the accumulated value corresponding to each of the possibly defective pixels and second threshold value THL2, an actually defective pixel is specified from the possibly defective pixels.
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