System and method for measuring and monitoring three-dimensional shaped objects
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United States of America Patent
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Jan 5, 1999
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N/A
app pub date -
Apr 25, 1997
filing date -
Apr 25, 1997
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Abstract
This invention discloses a system and method for measuring and monitoring three-dimensional shaped objects with projections of computer models of the objects. The computer models of the three-dimensional shaped objects are in the form of grid patterns. An image of the computer model of grid patterns is simultaneously projected from a dual projection system in two directions onto a real world instance of the object. Any variation between the computer model and the real world instance of the object is highlighted directly on the object by interference patterns of the two projections on the real world instance. The variation is quantified by counting the number of interference patterns on the real world instance of the object.
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