Oven for testing peripheral storage devices
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United States of America Patent
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Jan 12, 1999
Grant Date -
N/A
app pub date -
Sep 16, 1997
filing date -
Sep 16, 1996
priority date (Note) -
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Abstract
An oven for testing the quality of a peripheral storage devices including an aging room, configured to receive a plurality of peripheral storage devices to be tested therein, with upper and lower mixing rooms in fluid communication therewith. A support duct, having a circulation cavity, is in fluid communication with the upper and lower mixing rooms and has a plurality of discharge openings to the circulation cavity. Ducts draw in outside air while hot air is discharged.
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