Method of and apparatus for cleaning workpiece

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United States of America Patent

PATENT NO 5868866
SERIAL NO

08609686

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Abstract

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A method of and an apparatus for cleaning a thin disk-shaped workpiece that is required to have a high degree of cleanliness, e.g., a semiconductor wafer, a glass substrate, a liquid crystal display, or the like. The method of cleaning the workpiece includes a plurality of cleaning steps, and comprises the steps of holding a workpiece, and performing a liquid jet cleaning of a surface of the workpiece in a first portion of plural cleaning steps. The method further comprises the step of performing a liquid jet cleaning of the surface of the workpiece in a latter portion of the plural cleaning steps.

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Patent Owner(s)

  • EBARA CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maekawa, Toshiro Sagamihara, JP 13 274
Ono, Koji Fujisawa, JP 180 3292
Tsujimura, Manabu Yokohama, JP 79 1259

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