System for evaluating probing networks that have multiple probing ends
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United States of America Patent
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Feb 9, 1999
Issued Date -
N/A
app pub date -
May 30, 1997
filing date -
Apr 14, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An interconnect assembly for evaluating a probe measurement network includes a base, respective first, second and third device-probing areas arranged on an upper face of the base in spaced-apart relation so that first, second and third device-probing ends belonging to the measurement network can be simultaneously placed on these respective areas, a reference junction, and a high frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite variable positioning of the device-probing ends on the probing areas. Because the transmission structure uniformly transfers signals despite variable positioning of the device-probing ends, the measurement network can be accurately calibrated with reference, in particular, to the device-probing ends of the network by a reference unit connected to the reference junction.
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