Differential pressure measuring arrangement
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Mar 9, 1999
Grant Date -
N/A
app pub date -
Jul 22, 1998
filing date -
Aug 5, 1997
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An arrangement for measuring high pressure differences. The arrangement has a differential pressure sensor made using thin film technology. The arrangement has a metallic layer in which measuring resistors are arranged. The sensitive structures of the measuring resistors are kept away from aggressive measuring media by encapsulation.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully