Thin film semiconductor and method for manufacturing the same, semiconductor device and method for manufacturing the same
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United States of America Patent
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Apr 13, 1999
Issued Date -
N/A
app pub date -
Feb 19, 1997
filing date -
Feb 23, 1996
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Abstract
The present invention is related to a thin film semiconductor which can be regarded as substantially a single crystal and a semiconductor device comprising an active layer formed by the thin film semiconductor. At least a concave or convex pattern is formed intentionally on a insulating film provided in contact with the lower surface of an amorphous silicon film, whereby at least a site is formed in which a metal element for accelerating crystallization can be segregated. Therefore, a crystal nuclei is selectively formed in a portion where the concave or convex pattern is located, which carries out controlling a crystal diameter. Thus, a crystalline silicon film is obtained. A crystallinity of the crystalline silicon film is improved by the irradiation of a laser light or an intense light having an energy equivalent to that of the laser light, whereby a monodomain region in which no grain boundary substantially exit is formed.
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Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| SEMICONDUCTOR ENERGY LABORATORY CO LTD | 398 HASE ATSUGI-SHI KANAGAWA 2430036 ?2430036 |
International Classification(s)
Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Fukunaga, Takeshi | Kanagawa, JP | 231 | 14991 |
| Koyama, Jun | Kanagawa, JP | 1634 | 57063 |
| Miyanaga, Akiharu | Kanagawa, JP | 297 | 15670 |
| Yamazaki, Shunpei | Tokyo, JP | 7534 | 239327 |
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| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
| Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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