Manufacturing method for self-aligned local interconnects and contacts simultaneously

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United States of America Patent

PATENT NO 5899742
SERIAL NO

09035347

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Abstract

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The invention provides a novel method, in which self-aligned, borderless contacts and local interconnections of semiconductor devices are manufactured in an integral process. The method is compatible with the LOGIC self-aligned titanium silicide (SALICIDE) and N+/P+ poly dual gate process modules. That is, this invention provides a self-aligned local-interconnect and contact (SALIC) method for a logic technology to forming the self-aligned, borderless contacts, and local interconnects (LI) simultaneously.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPHSIN-CHU CITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sun, Shih-Wei 5F, No. 33, Alley 26, Lane 300, Jen-Ai Rd., Sec. 4, Taipei City, TW 79 2357

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